Two-photon X-ray Ghost Microscope

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2002.01668.pdf (485 KB)

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https://arxiv.org/abs/2002.01668

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http://hdl.handle.net/11603/17495

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UMBC Physics Department
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2020-02-05

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journal articles preprints
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Citation of Original Publication

Smith, Thomas A.; Wang, Zhehui; Shih, Yanhua; Two-photon X-ray Ghost Microscope; Optics (2020); https://arxiv.org/abs/2002.01668

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Abstract

Unlike classic imaging devices in the visible spectrum, there are no effective imaging lenses to produce the point-to-point image-forming function for high-energy (short-wavelength) X rays. The X-ray imaging that we are familiar with more closely resembles a projection or "shadow" of the object rather than a point-to-point image. Here, we present an imaging mechanism that produces true point-to-point imaging of X rays through the measurement of two-photon interference intensity fluctuation correlation, which allows for a table-top X-ray microscope by means of a magnified secondary ghost image. In principle, once some experimental barriers are overcome, this X-ray "ghost microscope" may achieve nanometer spatial resolution and open up new capabilities that would be of interest to the fields of physics, material science, and medical imaging.