A framework for quantifying the impacts of sub-pixel reflectance variance and covariance on cloud optical thickness and effective radius retrievals based on the bispectral method
dc.contributor.author | Zhang, Z. | |
dc.contributor.author | Werner, F. | |
dc.contributor.author | Wind, G. | |
dc.contributor.author | Platnick, S. | |
dc.contributor.author | Ackerman, A. S. | |
dc.contributor.author | Girolamo, L. Di | |
dc.contributor.author | Marshak, A. | |
dc.contributor.author | Meyer, Kerry | |
dc.contributor.author | Cho, H. M. | |
dc.date.accessioned | 2018-09-19T20:15:07Z | |
dc.date.available | 2018-09-19T20:15:07Z | |
dc.date.issued | 2017-02-22 | |
dc.description.abstract | The so-called bi-spectral method retrieves cloud optical thickness (τ) and cloud droplet effective radius (rₑ) simultaneously from a pair of cloud reflectance observations, one in a visible or near infrared (VIS/NIR) band and the other in a shortwave-infrared (SWIR) band. A cloudy pixel is usually assumed to be horizontally homogeneous in the retrieval. Ignoring sub-pixel variations of cloud reflectances can lead to a significant bias in the retrieved τ and rₑ. In this study, we use the Taylor expansion of a two-variable function to understand and quantify the impacts of sub-pixel variances of VIS/NIR and SWIR cloud reflectances and their covariance on the τ and rₑ retrievals. This framework takes into account the fact that the retrievals are determined by both VIS/NIR and SWIR band observations in a mutually dependent way. In comparison with previous studies, it provides a more comprehensive understanding of how sub-pixel cloud reflectance variations impact the τ and rₑ retrievals based on the bi-spectral method. In particular, our framework provides a mathematical explanation of how the sub-pixel variation in VIS/NIR band influences the rₑ retrieval and why it can sometimes outweigh the influence of variations in the SWIR band and dominate the error in rₑ retrievals, leading to a potential contribution of positive bias to the rₑ retrieval. | en_US |
dc.description.sponsorship | This research is supported by NASA grants NNX14AJ25G and NNX15AC77G | en_US |
dc.description.uri | https://aip.scitation.org/doi/pdf/10.1063/1.4975502 | en_US |
dc.format.extent | 7 pages | en_US |
dc.genre | journal article | en_US |
dc.identifier | doi:10.13016/M2TB0XZ84 | |
dc.identifier.citation | Z. Zhang, F. Werner, H. M. Cho, G. Wind, S. Platnick, A. S. Ackerman, L. Di Girolamo, A. Marshak, and Kerry Meyer, A framework for quantifying the impacts of sub-pixel reflectance variance and covariance on cloud optical thickness and effective radius retrievals based on the bispectral method, 2017, https://doi.org/10.1063/1.4975502 | en_US |
dc.identifier.uri | https://doi.org/10.1063/1.4975502 | |
dc.identifier.uri | http://hdl.handle.net/11603/11324 | |
dc.language.iso | en_US | en_US |
dc.publisher | American Institute of Physics (AIP) | en_US |
dc.relation.isAvailableAt | The University of Maryland, Baltimore County (UMBC) | |
dc.relation.ispartof | UMBC Joint Center for Earth Systems Technology | |
dc.relation.ispartof | UMBC Physics Department | |
dc.relation.ispartof | UMBC Faculty Collection | |
dc.rights | This item may be protected under Title 17 of the U.S. Copyright Law. It is made available by UMBC for non-commercial research and education. For permission to publish or reproduce, please contact the author. | |
dc.subject | bi-spectral method | en_US |
dc.subject | UMBC High Performance Computing Facility (HPCF) | en_US |
dc.subject | cloud optical thickness | |
dc.subject | loud droplet effective radius | |
dc.subject | cloud reflectance observations in a visible or near infrared (VIS/NIR) band | |
dc.subject | cloud reflectance observations, in a shortwave-infrared (SWIR) band | |
dc.subject | sub-pixel variations of cloud reflectances | |
dc.title | A framework for quantifying the impacts of sub-pixel reflectance variance and covariance on cloud optical thickness and effective radius retrievals based on the bispectral method | en_US |
dc.type | Text | en_US |