Third-Order Nonlinear Optical Properties of ALD Grown TiO₂ Films by Thermally Managed Z-scan Method
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Type of Work2 pages
Citation of Original PublicationI. Basaldua, P. Burkins, R. Kuis, J. A. Kropp, T. Gougousi, and A. M. Johnson, "Third-Order Nonlinear Optical Properties of ALD Grown TiO2 Films by Thermally Managed Z-scan Method," in Frontiers in Optics / Laser Science, OSA Technical Digest (Optical Society of America, 2018), paper JW4A.37.
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X ray diffraction
Thermally managed Z-scan performed on ALD grown TiO₂ films demonstrated n₂ values of 1.7×10⁻¹¹ and 1.94 × 10⁻¹⁰cm²/W for films grown at 100°C and 250°C, respectively – greater than 1000X that of other growth methods.