Two-photon X-ray Ghost Microscope
Links to Fileshttps://arxiv.org/abs/2002.01668
MetadataShow full item record
Type of Work9 pages
journal articles preprints
Citation of Original PublicationSmith, Thomas A.; Wang, Zhehui; Shih, Yanhua; Two-photon X-ray Ghost Microscope; Optics (2020); https://arxiv.org/abs/2002.01668
RightsThis item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.
Unlike classic imaging devices in the visible spectrum, there are no effective imaging lenses to produce the point-to-point image-forming function for high-energy (short-wavelength) X rays. The X-ray imaging that we are familiar with more closely resembles a projection or "shadow" of the object rather than a point-to-point image. Here, we present an imaging mechanism that produces true point-to-point imaging of X rays through the measurement of two-photon interference intensity fluctuation correlation, which allows for a table-top X-ray microscope by means of a magnified secondary ghost image. In principle, once some experimental barriers are overcome, this X-ray "ghost microscope" may achieve nanometer spatial resolution and open up new capabilities that would be of interest to the fields of physics, material science, and medical imaging.