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    • Cell deformation cytometry using diode-bar optical stretchers 

      Sraj, Ihab; Eggleton, Charles D.; Jimenez, Ralph; Hoover, Erich E.; Squier, Jeffrey A.; Chichester, Justin; Marr, David W. (Society of Photo-Optical Instrumentation Engineers., 2010-08-04)
      The measurement of cell elastic parameters using optical forces has great potential as a reagent-free method for cell classification, identification of phenotype, and detection of disease; however, the low throughput ...