Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry

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https://pubs.acs.org/doi/10.1021/jp802173m

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https://doi.org/10.1021/jp802173m
 http://hdl.handle.net/11603/29201

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UMBC Physics Department

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https://orcid.org/0000-0002-6370-8765

Date

2008-05-16

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journal articles
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Citation of Original Publication

Jung, Inhwa, Matthias Vaupel, Matthew Pelton, Richard Piner, Dmitriy A. Dikin, Sasha Stankovich, Jinho An, and Rodney S. Ruoff. “Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry.” The Journal of Physical Chemistry C 112, no. 23 (June 1, 2008): 8499–8506. https://doi.org/10.1021/jp802173m.

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This work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.
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Abstract

The dispersion functions for the refractive index and the extinction coefficient of single- and multiple-layer graphene oxide samples were measured by imaging spectroscopic ellipsometry in the wavelength range of 350−1000 nm and were compared to previously reported results measured by confocal microscopy. The dispersion functions for thin platelets were also compared to those obtained by standard spectroscopic ellipsometry on a deposit consisting of many overlapping graphene oxide layers. Changes were observed in both the thickness of the deposits and the values of the dispersion parameters following heating. A model is proposed to explain these observations, based on the removal of water between the graphene-oxide layers upon thermal treatment.