Simsek, ErgunCho, Emerson K.2024-09-042024-09-042024http://hdl.handle.net/11603/35973Similar to image sharpening, the resolution of measured electromagnetic fields can be enhanced with machine learning. We numerically demonstrate that a λ/10 spatial resolution is achievable even with probes that are a few wavelengths wide, while maintaining a maximum relative error of less than 3%.2 pagesen-USThis item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.Enhancement of Non-Destructive Measurement Resolution with Neural NetworksText