Basaldua, I.Burkins, P.Kuis, R.Kropp, J. A.Gougousi, T.Johnson, A. M.2018-10-112018-10-112018I. Basaldua, P. Burkins, R. Kuis, J. A. Kropp, T. Gougousi, and A. M. Johnson, "Third-Order Nonlinear Optical Properties of ALD Grown TiO2 Films by Thermally Managed Z-scan Method," in Frontiers in Optics / Laser Science, OSA Technical Digest (Optical Society of America, 2018), paper JW4A.37.http://hdl.handle.net/11603/11464Frontiers in Optics 2018Thermally managed Z-scan performed on ALD grown TiO₂ films demonstrated n₂ values of 1.7×10⁻¹¹ and 1.94 × 10⁻¹⁰cm²/W for films grown at 100°C and 250°C, respectively – greater than 1000X that of other growth methods.2 pagesen-USThis item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.© 2019 Optical Society of America. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.Light intensityNonlinear absorptionNonlinear opticalmaterialsRefractive indexSolgelX ray diffractionText