Smith, Thomas A.Wang, ZhehuiShih, Yanhua2020-03-052020-03-052020-02-05Smith, Thomas A.; Wang, Zhehui; Shih, Yanhua; Two-photon X-ray Ghost Microscope; Optics (2020); https://arxiv.org/abs/2002.01668http://hdl.handle.net/11603/17495Unlike classic imaging devices in the visible spectrum, there are no effective imaging lenses to produce the point-to-point image-forming function for high-energy (short-wavelength) X rays. The X-ray imaging that we are familiar with more closely resembles a projection or "shadow" of the object rather than a point-to-point image. Here, we present an imaging mechanism that produces true point-to-point imaging of X rays through the measurement of two-photon interference intensity fluctuation correlation, which allows for a table-top X-ray microscope by means of a magnified secondary ghost image. In principle, once some experimental barriers are overcome, this X-ray "ghost microscope" may achieve nanometer spatial resolution and open up new capabilities that would be of interest to the fields of physics, material science, and medical imaging.9 pagesen-USThis item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.Text