Young, Joshua T.Menyuk, CurtisHu, Jonathan2024-03-052024-03-052022-05J. T. Young, C. R. Menyuk, and J. Hu, "Comparison of the full model and phase-matched model for transverse mode instability," in Conference on Lasers and Electro-Optics, Technical Digest Series (Optica Publishing Group, 2022), paper SM2L.5. https://doi.org/10.1364/CLEO_SI.2022.SM2L.5https://doi.org/10.1364/CLEO_SI.2022.SM2L.5http://hdl.handle.net/11603/317842022 Conference on Lasers and Electro-Optics (CLEO), San Jose, CA, USA, 15-20 May 2022.We compare the full model and phase-matched model for the transverse mode instability. The phase-matched model, which requires less longitudinal discretization with less computational time, predicts the same refractive index gratings as the full model.2 pagesThis item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.Text