Browsing by Subject "Refractive index"
Now showing 1 - 3 of 3
Results Per Page
Sort Options
Item Aerosol and surface properties characterization from joint inversion of ground-based and satellite observations(Optica, 2007-02-11) Sinyuk, Alexander; Dubovik, Oleg; Holben, Brent; Eck, Thomas; Breon, Francois-Marie; Martonchik, John; Kahn, Ralph; Diner, David J.; Vermote, Eric F.; Roger, Jean-Claude; Lapyonok, Tatyana; Slutsker, IlyaA method for simultaneously retrieving aerosol and surface parameters from ground based and satellite observations collocated in space and time is presented. The improvements in aerosol and surface reflectance characterization are discussed.Item Modified Ångström exponent for the characterization of submicrometer aerosols(Optica, 2001-05-20) O’Neill, Norm T.; Dubovik, Oleg; Eck, ThomasThe classical Ångström exponent is an operationally robust optical parameter that contains size information on all optically active aerosols in the field of view of a sunphotometer. Assuming that the optical effects of a typical (radius) size distribution can be approximated by separate submicrometer and supermicrometer components, we show that one can exploit the spectral curvature information in the measured optical depth to permit a direct estimation of a fine-mode (submicrometer) Ångström exponent (αբ) as well as the optical fraction of fine-mode particles (η). Simple expressions that enable the estimation of these parameters are presented and tested by use of simulations and measurements.Item Third-Order Nonlinear Optical Properties of ALD Grown TiO₂ Films by Thermally Managed Z-scan Method(Optical Society of America, 2018) Basaldua, I.; Burkins, P.; Kuis, R.; Kropp, J. A.; Gougousi, T.; Johnson, A. M.Thermally managed Z-scan performed on ALD grown TiO₂ films demonstrated n₂ values of 1.7×10⁻¹¹ and 1.94 × 10⁻¹⁰cm²/W for films grown at 100°C and 250°C, respectively – greater than 1000X that of other growth methods.