Two-photon X-ray Ghost Microscope
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Smith, Thomas A., Zhehui Wang, and Yanhua Shih. “Two-Photon X-Ray Ghost Microscope.” Optics Express 28, no. 22 (2020): 32249–65. https://doi.org/10.1364/OE.401449.
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This work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law
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Abstract
This article presents a non-classical imaging mechanism that produces a diffraction-limited and magnified ghost image of the internal structure of an object through the measurement of intensity fluctuation correlation formed by two-photon interference. In principle, the lensless X-ray ghost imaging mechanism may achieve a spatial resolution determined by the wavelength and the angular diameter of the X-ray source, ∼λ/Δθs, with possible reduction caused by additional optics. In addition, it has the ability to image select “slices” deep within an object, which can be used for constructing 3D view of its internal structure.