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dc.contributor.authorSmith, Thomas A.
dc.contributor.authorWang, Zhehui
dc.contributor.authorShih, Yanhua
dc.date.accessioned2020-03-05T18:17:34Z
dc.date.available2020-03-05T18:17:34Z
dc.date.issued2020-02-05
dc.description.abstractUnlike classic imaging devices in the visible spectrum, there are no effective imaging lenses to produce the point-to-point image-forming function for high-energy (short-wavelength) X rays. The X-ray imaging that we are familiar with more closely resembles a projection or "shadow" of the object rather than a point-to-point image. Here, we present an imaging mechanism that produces true point-to-point imaging of X rays through the measurement of two-photon interference intensity fluctuation correlation, which allows for a table-top X-ray microscope by means of a magnified secondary ghost image. In principle, once some experimental barriers are overcome, this X-ray "ghost microscope" may achieve nanometer spatial resolution and open up new capabilities that would be of interest to the fields of physics, material science, and medical imaging.en_US
dc.description.urihttps://arxiv.org/abs/2002.01668en_US
dc.format.extent9 pagesen_US
dc.genrejournal articles preprintsen_US
dc.identifierdoi:10.13016/m26crw-dfjc
dc.identifier.citationSmith, Thomas A.; Wang, Zhehui; Shih, Yanhua; Two-photon X-ray Ghost Microscope; Optics (2020); https://arxiv.org/abs/2002.01668en_US
dc.identifier.urihttp://hdl.handle.net/11603/17495
dc.language.isoen_USen_US
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Physics Department Collection
dc.relation.ispartofUMBC Faculty Collection
dc.rightsThis item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.
dc.titleTwo-photon X-ray Ghost Microscopeen_US
dc.typeTexten_US


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