Observation of Low-Contrast All-Optical Switching in Si₃N₄ Microdisks Based on the Zeno Effect
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2012-06Type of Work
2 pagesText
conference papers and proceedings
Citation of Original Publication
S. M. Hendrickson, C. N. Weiler, R. M. Camacho, P. T. Rakich, A. I. Young, M. J. Shaw, T. B. Pittman, J. D. Franson, and B. C. Jacobs, "Observation of Low-Contrast All-Optical Switching in Si₃N₄ Microdisks Based on the Zeno Effect," in Advanced Photonics Congress, OSA Technical Digest (online) (Optical Society of America, 2012), paper NM3C.4., https://doi.org/10.1364/NP.2012.NM3C.4Rights
This item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.Abstract
Low-contrast all-optical Zeno switching has been demonstrated in a Silicon Nitride microdisk resonator surrounded by hot Rubidium vapor. The device is based on the suppression of the cavity field buildup due to non-degenerate two-photon absorption.