Observation of Low-Contrast All-Optical Switching in Si₃N₄ Microdisks Based on the Zeno Effect

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NP-2012-NM3C.4.pdf (209.33 KB)

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https://www.osapublishing.org/abstract.cfm?uri=NP-2012-NM3C.4

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https://doi.org/10.1364/NP.2012.NM3C.4
 http://hdl.handle.net/11603/19354

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UMBC Physics Department
UMBC Faculty Collection
UMBC Joint Center for Earth Systems Technology (JCET)

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Date

2012-06

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conference papers and proceedings
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Citation of Original Publication

S. M. Hendrickson, C. N. Weiler, R. M. Camacho, P. T. Rakich, A. I. Young, M. J. Shaw, T. B. Pittman, J. D. Franson, and B. C. Jacobs, "Observation of Low-Contrast All-Optical Switching in Si₃N₄ Microdisks Based on the Zeno Effect," in Advanced Photonics Congress, OSA Technical Digest (online) (Optical Society of America, 2012), paper NM3C.4., https://doi.org/10.1364/NP.2012.NM3C.4

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Abstract

Low-contrast all-optical Zeno switching has been demonstrated in a Silicon Nitride microdisk resonator surrounded by hot Rubidium vapor. The device is based on the suppression of the cavity field buildup due to non-degenerate two-photon absorption.