Accelerating Storage Lifetime Testing of Microcalorimeter Arrays for NewAthena X-IFU

dc.contributor.authorFuhrman, Joshua
dc.contributor.authorFinkbeiner, Fred M.
dc.contributor.authorAdams, Joseph S.
dc.contributor.authorBandler, Simon R.
dc.contributor.authorBorrelli, Rachel B.
dc.contributor.authorChervenak, James A.
dc.contributor.authorFarrahi, Tannaz
dc.contributor.authorPetit, Felipe A. Colazo
dc.contributor.authorCumbee, Renata S.
dc.contributor.authorHull, Samuel V.
dc.contributor.authorKelley, Richard L.
dc.contributor.authorKilbourne, Caroline A.
dc.contributor.authorMuramatsu, Haruka
dc.contributor.authorPorter, F. Scott
dc.contributor.authorRani, Asha
dc.contributor.authorSakai, Kazuhiro
dc.contributor.authorSmith, Stephen J.
dc.contributor.authorVenkatasubraman, Ambarish C.
dc.contributor.authorWakeham, Nicholas
dc.contributor.authorWassell, Edward J.
dc.contributor.authorWitthoeft, Michael C.
dc.contributor.authorYoon, Sang H.
dc.date.accessioned2026-02-12T16:44:25Z
dc.date.issued2025-12-26
dc.description.abstractThe X-IFU instrument for ESA's upcoming flagship mission Athena will use Mo/Au bilayer transition-edge sensors (TES) with Au/Bi X-ray absorbers to form a kilo-pixel microcalorimeter array. Such detectors require careful calibration to maintain their best possible performance, but such calibrations can change over long periods of time when exposed to certain environmental conditions. We have previously reported the effects of humidity and elevated temperature on prototype array characteristics. In that study, storage of a prototype array at 60° C for 10 days under vacuum produced an unexpected shift in the TES critical temperature T꜀ (+13 to +19%) and normal resistance Rₙ (+4%). In this work, we continue investigating shifts in array characteristics after long-duration temperature exposures so that safe storage and handling conditions for X-IFU flight arrays can be set. A prototype array exposed to 35° C under vacuum for 26 days gradually increased in TES normal resistance. The energy scale of a second prototype array was measured before aging and then recovered to within 0.5 eV following a similar aging induced Rn increase. Aging of the TES was studied directly by applying the same thermal conditions exclusively to Mo/Au bilayers on Si substrate. These measurements allow a better understanding of the cause of the observed shift by decoupling the TES bilayer from the remaining device structures such as the SiNx membrane and the absorber. Four-point resistance measurements were used to readout the bilayer samples at 4.2 K. Bilayers aged in a vacuum generally saw no change or a slight increase in resistance, while bilayers aged in nitrogen gas decreased in resistance. Finally, we conclude with a comparative overview of all test results on prototype arrays and TES bilayers, elaborate on possible mechanisms for the observed shifts in characteristics, and make recommendations for maintaining the long-term stability of our devices.
dc.description.sponsorshipThis work was supported by NASA under Grant 90GSFC24M0006. (
dc.description.urihttps://ieeexplore.ieee.org/abstract/document/11316377/
dc.format.extent7 pages
dc.genrejournal articles
dc.identifierdoi:10.13016/m2wqqw-3kut
dc.identifier.citationFuhrman, Joshua D., Fred M. Finkbeiner, Joseph S. Adams, et al. "Accelerating Storage Lifetime Testing of Microcalorimeter Arrays for NewAthena X-IFU". IEEE Transactions on Applied Superconductivity, 2025, 1–7. https://doi.org/10.1109/TASC.2025.3648679.
dc.identifier.urihttps://doi.org/10.1109/TASC.2025.3648679
dc.identifier.urihttp://hdl.handle.net/11603/41900
dc.language.isoen
dc.publisherIEEE
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Faculty Collection
dc.relation.ispartofUMBC Center for Space Sciences and Technology (CSST) / Center for Research and Exploration in Space Sciences & Technology II (CRSST II)
dc.rightsThis work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.
dc.rightsPublic Domain
dc.rights.urihttps://creativecommons.org/publicdomain/mark/1.0/
dc.subjectSemiconductor device measurement
dc.subjectTemperature measurement
dc.subjectDetectors
dc.subjectTemperature sensors
dc.subjectSuperconducting devices
dc.subjectResistance
dc.subjectOvens
dc.subjectPollution measurement
dc.subjectPrototypes
dc.subjectAging
dc.subjectAccelerated aging
dc.subjectElectrical resistance measurement
dc.subjectX-ray telescopes
dc.titleAccelerating Storage Lifetime Testing of Microcalorimeter Arrays for NewAthena X-IFU
dc.typeText
dcterms.creatorhttps://orcid.org/0000-0002-9159-6561
dcterms.creatorhttps://orcid.org/0000-0002-9247-3010
dcterms.creatorhttps://orcid.org/0000-0001-8397-9338

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