Dielectric properties of conductively loaded polyimides in the far infrared

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https://opg.optica.org/ol/abstract.cfm?uri=ol-43-21-5303

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https://doi.org/10.1364/OL.43.005303
 http://hdl.handle.net/11603/25040

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UMBC Center for Space Sciences and Technology (CSST) / Center for Research and Exploration in Space Sciences & Technology II (CRSST II)

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https://orcid.org/0000-0001-9238-4918

Date

2018-10-23

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journal articles
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Citation of Original Publication

Kyle Helson et al. "Dielectric properties of conductively loaded polyimides in the far infrared". Optics letters 43 (21), (01 November 2018) 5303-5306. https://doi.org/10.1364/OL.43.005303

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This work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.
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Abstract

The dielectric properties of selected conductively-loaded polyimide samples are characterized in microwave through far infrared wavebands. These materials, belonging to the Vespel® family, are more readily formed by direct machining than their ceramic loaded epoxy counterparts and present an interesting solution for realizing absorptive optical control structures. Measurements spanning a spectral range from 1 to 600 cm−1 (0.03 to 18 THz) were preformed and used in parametrization of the media’s dielectric function at frequencies below ≈ 3 THz.