Metal-Enhanced Fluorescence (MEF): Physical characterization of Silver-island films and exploring sample geometries

Files

nihms138951.pdf (1.05 MB)

Links to Files

https://www.sciencedirect.com/science/article/pii/S0009261409008525

Permanent Link

https://doi.org/10.1016/j.cplett.2009.07.033
 http://hdl.handle.net/11603/36553

Collections

UMBC Chemistry & Biochemistry Department
UMBC Institute of Fluorescence (IoF)

Author/Creator

Author/Creator ORCID

https://orcid.org/0000-0002-9110-6374

Date

2009-07-12

Type of Work

journal articles
postprints
Text

Department

Program

Citation of Original Publication

Pribik, R., A. I. Dragan, Y. Zhang, C. Gaydos, and C. D. Geddes. “Metal-Enhanced Fluorescence (MEF): Physical Characterization of Silver-Island Films and Exploring Sample Geometries.” Chemical Physics Letters 478, no. 1 (August 17, 2009): 70–74. https://doi.org/10.1016/j.cplett.2009.07.033.

Rights

Attribution-NonCommercial-NoDerivatives 4.0 International

Subjects

Abstract

In this study we have analyzed metal-enhanced fluorescence (MEF) effects from different density Silver-island films (SiFs) and the effects of sample geometry on the observed enhancement of fluorescence (EF). It is shown that silver islands grow exponentially with SiF deposition time (DT<5min), optical density of SiFs almost linearly depends on DT; electrical conductivity is zero. At DT>5min, silver islands merge, exhibiting a sharp increase in electrical conductivity. It has been shown that the newly proposed SiF sample geometry exhibits higher EF values than the commonly used in MEF studies SiF–SiF sample geometry. The SiF–glass geometry demonstrates high sensitivity for surface immunoassays, a growing application of metal-enhanced fluorescence.