Investigation of NiV-based multilayers for the high energy x-ray probe

dc.contributor.authorGellert, N. C.
dc.contributor.authorMadsen, K. K.
dc.contributor.authorMassahi, S.
dc.contributor.authorSanz, D.
dc.contributor.authorFerreira, D. D. M.
dc.contributor.authorSvendsen, S.
dc.contributor.authorJegers, A. S.
dc.contributor.authorChristensen, F. E.
dc.date.accessioned2023-10-26T14:43:09Z
dc.date.available2023-10-26T14:43:09Z
dc.date.issued2023-10-05
dc.descriptionSPIE Optical Engineering + Applications; San Diego, California, United States; 2023en_US
dc.description.abstractThe High Energy X-ray Probe (HEX-P) is a NASA probe-class mission concept that will combine high spatial resolution x-ray imaging (⪅10 arcsec FWHM) and broad spectral coverage (0.1 to 150 keV) with an effective area far superior to current facilities (including XMM-Newton and NuSTAR) to enable revolutionary new insights into a variety of important astrophysical problems. Optimized nanometer-thin Ni-based multilayer coatings enable high performance of focusing X-ray telescopes to energies up to 150 keV and beyond, though current fabricated Ni-based coatings contain high interfacial roughness which will affect the predicted performance of the telescope. As part of the thin film coating development for the High Energy X-ray Probe, we report on the current development of reducing the coating roughness in periodic NiV/Si multilayer coatings. The multilayers are fabricated using the direct current magnetron sputtering coating facility at DTU Space, using different types of sputtering collimators and different reactive sputtering gas concentrations, optimized for the production of low interfacial roughness. The multilayers are characterized using x-ray reflectometry and x-ray photoelectron spectroscopy. More information on HEX-P, including the full team list, is available at hexp.org.en_US
dc.description.urihttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/12679/126791F/Investigation-of-NiV-based-multilayers-for-the-high-energy-x/10.1117/12.2676128.fullen_US
dc.format.extent24 pagesen_US
dc.genreconference papers and proceedingsen_US
dc.genrepostersen_US
dc.identifierdoi:10.13016/m23nrn-1yts
dc.identifier.citationN. C. Gellert, K. K. Madsen, S. Massahi, D. Sanz, D. D. M. Ferreira, S. Svendsen, A. S. Jegers, and F. E. Christensen "Investigation of NiV-based multilayers for the high energy x-ray probe", Proc. SPIE 12679, Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI, 126791F (5 October 2023); https://doi.org/10.1117/12.2676128en_US
dc.identifier.urihttps://doi.org/10.1117/12.2676128
dc.identifier.urihttp://hdl.handle.net/11603/30386
dc.language.isoen_USen_US
dc.publisherSPIEen_US
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Center for Space Sciences and Technology
dc.relation.ispartofUMBC Faculty Collection
dc.relation.ispartofUMBC Physics Department
dc.rights© 2023 Society of Photo-Optical Instrumentation Engineers (SPIE)en_US
dc.titleInvestigation of NiV-based multilayers for the high energy x-ray probeen_US
dc.typeTexten_US

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