Short term X-ray rms variability of Cyg X-1
| dc.contributor.author | Gleissner, T. | |
| dc.contributor.author | Wilms, J. | |
| dc.contributor.author | Pottschmidt, Katja | |
| dc.contributor.author | Uttley, P. | |
| dc.contributor.author | Nowak, M.A. | |
| dc.contributor.author | Staubert, R. | |
| dc.date.accessioned | 2023-10-12T19:19:01Z | |
| dc.date.available | 2023-10-12T19:19:01Z | |
| dc.date.issued | 2002-07-29 | |
| dc.description.abstract | A linear dependence of the amplitude of broadband noise variability on flux for GBHC and AGN has been recently shown by Uttley & McHardy (2001). We present the long term evolution of this rms-flux-relation for Cyg X-1 as monitored from 1998-2002 with RXTE. We confirm the linear relationship in the hard state and analyze the evolution of the correlation for the period of 1996-2002. In the intermediate and the soft state, we find considerable deviations from the otherwise linear relationship. A possible explanation for the rms-flux-relation is a superposition of local mass accretion rate variations. | en_US |
| dc.description.uri | https://arxiv.org/abs/astro-ph/0207610 | en_US |
| dc.format.extent | 3 pages | en_US |
| dc.genre | journal articles | en_US |
| dc.genre | preprints | en_US |
| dc.identifier | doi:10.13016/m2th6t-3lsj | |
| dc.identifier.uri | https://doi.org/10.48550/arXiv.astro-ph/0207610 | |
| dc.identifier.uri | http://hdl.handle.net/11603/30117 | |
| dc.language.iso | en_US | en_US |
| dc.relation.isAvailableAt | The University of Maryland, Baltimore County (UMBC) | |
| dc.relation.ispartof | UMBC Center for Space Sciences and Technology | |
| dc.relation.ispartof | UMBC Physics Department | |
| dc.rights | This item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author. | en_US |
| dc.title | Short term X-ray rms variability of Cyg X-1 | en_US |
| dc.type | Text | en_US |
| dcterms.creator | https://orcid.org/0000-0002-4656-6881 | en_US |