Electrical characteristics of manganese and gallium doped meta-stable silicate and phosphate bone materials

dc.contributor.authorTangirala, Nithin V.
dc.contributor.authorGower, Daniel H.
dc.contributor.authorPeabody, Jakob C.
dc.contributor.authorGower, Lauren N.
dc.contributor.authorScheurer, Leslie A.
dc.contributor.authorSu, Ching Hua
dc.contributor.authorCullum, Brian
dc.contributor.authorArnold, Bradley
dc.contributor.authorChoa, Fow-Sen
dc.contributor.authorPrasad, Narasimha
dc.contributor.authorSingh, Narsingh
dc.date.accessioned2026-01-22T16:18:57Z
dc.date.issued2025-12-09
dc.description.abstractHydroxyapatites are important and major component of the body and play a vital role in the development of bones and teeth. Although bone regeneration involves various complex biological processes, calcium silicates and phosphates have been proven as important components for bone regenerative properties. The aim of the present study is to study the effect of manganese and gallium doping on the electrical properties in the silicate and phosphate bone materials which can affect the regenerative properties. Source materials were compacted in the form of pellets and processed at 600 °C for sintering and grain growth with and without selenium flux. Processing at 600 °C produced metastable grains transitioning from crystalline to glassy phase and hence and hence easier to merge in existing grains in presence of selenium. Silica rich material showed crystalline bones, and phosphorous rich phases facilitated the glassy behavior. Thermogravimetric analysis (TGA) showed stability up to 350 °C and continuous decomposition at high temperature. We observed that dielectric constant and resistivity for the frequency range of 100 Hz to 100,000 Hz at bias voltage 50 mV to 1000mV did not change, which indicates that breakdown of the ceramic material did not occur despite lower resistivity.
dc.description.sponsorshipWe are grateful and would like to acknowledge supports of Biological and Physical Science Division, Science Mission Directorate, Authors are also grateful to the program and management team of the NASA, Marshall Space Flight Center Huntsville for the leverage to support students for training relevant to space problems.
dc.description.urihttps://link.springer.com/article/10.1007/s10832-025-00440-x
dc.format.extent15 pages
dc.genrejournal articles
dc.identifierdoi:10.13016/m2ecc1-mfvu
dc.identifier.citationTangirala, Nithin V., Daniel H. Gower, Jakob C. Peabody, et al. “Electrical Characteristics of Manganese and Gallium Doped Meta-Stable Silicate and Phosphate Bone Materials.” Journal of Electroceramics,December 9, 2025. https://doi.org/10.1007/s10832-025-00440-x.
dc.identifier.urihttps://doi.org/10.1007/s10832-025-00440-x
dc.identifier.urihttp://hdl.handle.net/11603/41522
dc.language.isoen
dc.publisherNature
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Computer Science and Electrical Engineering Department
dc.relation.ispartofUMBC Chemistry & Biochemistry Department
dc.relation.ispartofUMBC Faculty Collection
dc.relation.ispartofUMBC Student Collection
dc.relation.ispartofUMBC Center for Cybersecurity
dc.rightsThis work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.
dc.rightsPublic Domain
dc.rights.urihttps://creativecommons.org/publicdomain/mark/1.0/
dc.subjectCoarsening
dc.subjectGrain growth
dc.subjectDielectric constant
dc.subjectMicrostructure
dc.subjectBone material
dc.titleElectrical characteristics of manganese and gallium doped meta-stable silicate and phosphate bone materials
dc.typeText
dcterms.creatorhttps://orcid.org/0000-0002-5250-8290
dcterms.creatorhttps://orcid.org/0000-0001-9613-6110
dcterms.creatorhttps://orcid.org/0000-0002-1810-0283

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