Security Compliance for Smart Manufacturing using Knowledgegraph based Digital Twin

dc.contributor.authorTamboli, Javed
dc.contributor.authorJoshi, Karuna
dc.contributor.authorClark, Ommo
dc.date.accessioned2026-01-07T19:43:54Z
dc.date.issued2026-03-06
dc.descriptionIEEE Big Data 2025, December 8-11, 2025, Macau, China
dc.description.abstractThe combination of Information Technology (IT) and Operational Technology (OT) in smart manufacturing, driven by smart factory innovations and Internet of Things (IoT) devices, generates vast, diverse, and rapidly evolving Big Data, which in turn increases cybersecurity and compliance issues. Adherence to security standards, such as NIST SP 800-171, which requires rigorous access control and audit reporting, is currently obstructed by the resource-intensive and error-prone aspects of manual evaluations. We have developed a semantically rich knowledge graph-based digital twin to automate security compliance of the smart assembly line, specifically focusing on categories specified in NIST SP 800-171. We have used Semantic Web technologies like RDF, OWL, and SPARQL using the Jena Fuseki server to build our system. Our approach improves data integrity and structure identification in IT/OT systems by tackling the Big Data 5Vs. The qualitative assessment of our digital twin shows a scalable approach with reduced compliance violations and enhanced audit effectiveness. In this paper, we describe our design in detail along with the validation results. This study propels future investigations by integrating Knowledge graphs and reasoning with industrial compliance, establishing a basis for automated compliance in smart manufacturing.
dc.description.sponsorshipWe thank Dr. Nilanjan Banerjee and Samrat Badola for collaborating on this research. This research was partially supported by the NSF award 2310844, IUCRC Phase II UMBC: Center for Accelerated Real time Analytics (CARTA) and UMBC’s 2024 COEIT Interdisciplinary Proposal award
dc.description.urihttps://ieeexplore.ieee.org/abstract/document/11402304
dc.format.extent10 pages
dc.genreconference papers and proceedings
dc.genrepreprints
dc.identifierdoi:10.13016/m2j8jz-1cal
dc.identifier.citationTamboli, Javed, Karuna Pande Joshi, and Ommo Clark. “Security Compliance for Smart Manufacturing Using Knowledgegraph Based Digital Twin.” 2025 IEEE International Conference on Big Data (BigData), December 2025, 6634–43. https://doi.org/10.1109/BigData66926.2025.11402304.
dc.identifier.urihttp://hdl.handle.net/11603/41425
dc.identifier.urihttps://doi.org/10.1109/BigData66926.2025.11402304
dc.language.isoen
dc.publisherIEEE
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Information Systems Department
dc.relation.ispartofUMBC Faculty Collection
dc.relation.ispartofUMBC Computer Science and Electrical Engineering Department
dc.relation.ispartofUMBC Student Collection
dc.rights© 2026 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.subjectUMBC Cybersecurity Institute
dc.subjectUMBC Knowledge, Analytics, Cognitive and Cloud Computing (KnACC) lab
dc.subjectUMBC Ebiquity Research Group
dc.titleSecurity Compliance for Smart Manufacturing using Knowledgegraph based Digital Twin
dc.typeText
dcterms.creatorhttps://orcid.org/0000-0002-6354-1686
dcterms.creatorhttps://orcid.org/0009-0002-8607-3464

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