Defect and transport properties of nanocrystalline CeO2−x

dc.contributor.authorChiang, Y.‐M.
dc.contributor.authorLavik, Erin
dc.contributor.authorKosacki, I.
dc.contributor.authorTuller, H. L.
dc.contributor.authorYing, J. Y.
dc.date.accessioned2021-03-19T17:32:06Z
dc.date.available2021-03-19T17:32:06Z
dc.description.abstractIt is shown that unique defect thermodynamics and transport properties result for oxides of a few nanometers crystallite size. Fully‐dense CeO2−x polycrystals of ∼10 nm grain size were synthesized, and their electrical properties compared with those of samples coarsened from the same material. The nanocrystals showed reduced grain boundary resistance, 104 higher electronic conductivity, and less than one‐half the heat of reduction of its coarse‐grained counterpart. These properties are attributed to a dominant role of interfacial defect formation.en_US
dc.description.sponsorshipWe thank H. Ackler for TEM and D. A. Blom, K. Bryden, and O. Porat for experimental assistance. This work was primarily supported by the U. S. Department of Energy, Office of Basic Energy Sciences, Grant No. DE-FG02-90ER45307. Collaborations between Y.M.C., H.L.T., and J.Y.Y., and Shared Facilities at MIT were supported by the National Science Foundation under Award No. DMR94-00334. E.B.L. acknowledges the support of an NSF Graduate Fellowshipen_US
dc.description.urihttps://aip.scitation.org/doi/abs/10.1063/1.117366en_US
dc.format.extent4 pagesen_US
dc.genrejournal articlesen_US
dc.identifierdoi:10.13016/m2jb4o-vgt2
dc.identifier.citationY.‐M. Chiang, E. B. Lavik, I. Kosacki, H. L. Tuller, and J. Y. Ying, Defect and transport properties of nanocrystalline CeO2−x, Appl. Phys. Lett. 69, 185 (1996); https://doi.org/10.1063/1.117366en_US
dc.identifier.urihttps://doi.org/10.1063/1.117366
dc.identifier.urihttp://hdl.handle.net/11603/21196
dc.language.isoen_USen_US
dc.publisherAIP publishingen_US
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Chemical, Biochemical & Environmental Engineering Department Collection
dc.rightsThis item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.
dc.rightsThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Chiang et al., Defect and transport properties of nanocrystalline CeO2−x, Appl. Phys. Lett. 69, 185 (1996); https://doi.org/10.1063/1.117366 and may be found at https://doi.org/10.1063/1.117366.
dc.titleDefect and transport properties of nanocrystalline CeO2−xen_US
dc.typeTexten_US

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