Does Aging Matter? The Curious Case of Fault Sensitivity Analysis
| dc.contributor.author | Ebrahimabadi, Mohammad | |
| dc.contributor.author | Fadaeinia, Bijan | |
| dc.contributor.author | Moradi, Amir | |
| dc.contributor.author | Karimi, Naghmeh | |
| dc.date.accessioned | 2022-03-24T19:23:19Z | |
| dc.date.available | 2022-03-24T19:23:19Z | |
| dc.description.abstract | An adversary with physical access to a cryptographic device may place the device under an external stress such as over clocking, and under-volting in order to generate erroneous outputs based on which the keys can be retrieved. Among fault-injection attacks, Fault Sensitivity Analysis (FSA) has received considerable attention in recent years as in this attack the adversary does not need to know the faulty output; rather he/she only needs to know whether the injected fault has led to an error or not. Although fault-injection attacks, and in particular FSA, have been extensively studied in literature and a number of countermeasures have been proposed to mitigate these attacks, the impact of device aging on the success of these attacks is still an open question. Due to aging, the specifications of transistors deviate from their fabrication-time specification, leading to a change of circuit’s delay over time. In this paper, we focus on the impact of aging in collision timing attacks (one of the strongest variant of FSA attacks). The corresponding results, realized by extensive HSpice simulations, show that the aging-induced impacts can facilitate such an attack. This calls for aging-resilient countermeasures that sustain the security over the lifetime of the cryptographic devices. | en_US |
| dc.description.sponsorship | The work described in this paper has been supported in part by the National Science Foundation CAREER Award (NSF CNS-1943224), and in part by the Deutsche Forschungsgemeinschaft (DFG) through the Germany’s Excellence Strategy under Grant EXC 2092 CASA-390781972 and the Project “Aged but Fit” under Grant 418658052. | en_US |
| dc.format.extent | 6 pages | en_US |
| dc.genre | journal articles | en_US |
| dc.genre | preprints | en_US |
| dc.identifier | doi:10.13016/m2rq7c-oykl | |
| dc.identifier.uri | http://hdl.handle.net/11603/24425 | |
| dc.language.iso | en_US | en_US |
| dc.relation.isAvailableAt | The University of Maryland, Baltimore County (UMBC) | |
| dc.relation.ispartof | UMBC Computer Science and Electrical Engineering Department Collection | |
| dc.relation.ispartof | UMBC Faculty Collection | |
| dc.rights | This item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author. | en_US |
| dc.title | Does Aging Matter? The Curious Case of Fault Sensitivity Analysis | en_US |
| dc.type | Text | en_US |
| dcterms.creator | https://orcid.org/0000-0002-5825-6637 | en_US |