Modeling Sources of Nonlinearity in a Simple p-i-n Photodetector

dc.contributor.authorHu, Yue
dc.contributor.authorMarks, Brian S.
dc.contributor.authorMenyuk, Curtis
dc.contributor.authorUrick, Vincent J.
dc.contributor.authorWilliams, Keith J.
dc.date.accessioned2018-10-11T13:20:14Z
dc.date.available2018-10-11T13:20:14Z
dc.date.issued2015-10-15
dc.description.abstractNonlinearity in p-i-n photodetectors leads to power generation at harmonics of the input frequency, limiting the performance of RF- photonic systems. We use one-dimensional and two-dimensional simulations of the drift-diffusion equations to determine the physical origin of the saturation in a simple heterojunction p-i-n photodetector at room temperature. Incomplete ionization, external loading, impact ionization, and the Franz–Keldysh effect are all included in the model. Impact ionization is the main source of nonlinearity at large reverse bias (>10 V in the device that we simulated). The electron and hole current contributions to the second harmonic power were calculated. We find that impact ionization has a greater effect on the electrons than it does on the holes. We also find that the hole velocity saturates slowly with increasing reverse bias, and the hole current makes a large contribution to the harmonic power at 10 V. This result implies that decreasing the hole injection will decrease the harmonic power.en_US
dc.description.urihttps://ieeexplore.ieee.org/document/6783718en_US
dc.format.extent11 pagesen_US
dc.genreJournal Article pre-printen_US
dc.identifierdoi:10.13016/M2BZ61C5F
dc.identifier.citationYue Hu, Brian S. Marks, Curtis R. Menyuk, Vincent J. Urick, Keith J. Williams, Modeling Sources of Nonlinearity in a Simple p-i-n Photodetector, Journal of Lightwave Technology ( Volume: 32 , Issue: 20 , Oct.15, 15 2014 ), 10.1109/JLT.2014.2315740en_US
dc.identifier.uri10.1109/JLT.2014.2315740
dc.identifier.urihttp://hdl.handle.net/11603/11466
dc.language.isoen_USen_US
dc.publisherIEEEen_US
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Computer Science and Electrical Engineering Department Collection
dc.relation.ispartofUMBC Faculty Collection
dc.rightsThis item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.*
dc.rightsPublic Domain Mark 1.0*
dc.rightsThis work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.
dc.rights.urihttp://creativecommons.org/publicdomain/mark/1.0/*
dc.subject2D simulationen_US
dc.subjectimpact ionizationen_US
dc.subjectnonlinearityen_US
dc.subjectp-i-n photodetectoren_US
dc.subjectUMBC High Performance Computing Facility (HPCF)en_US
dc.titleModeling Sources of Nonlinearity in a Simple p-i-n Photodetectoren_US
dc.typeTexten_US

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