All Optical Approach to Determine Quality and Performance of Sensor Material
dc.contributor.author | Setera, Brett | |
dc.contributor.author | Brandt, Meghan | |
dc.contributor.author | Emge, Ian | |
dc.contributor.author | Su, Ching Hua H. | |
dc.contributor.author | Arnold, Bradley | |
dc.contributor.author | Choa, Fow-Sen | |
dc.contributor.author | Cullum, Brian | |
dc.contributor.author | Singh, Narsingh | |
dc.contributor.author | Scheurer, Leslie | |
dc.date.accessioned | 2023-06-30T15:58:05Z | |
dc.date.available | 2023-06-30T15:58:05Z | |
dc.date.issued | 2023-06-14 | |
dc.description | SPIE Defense + Commercial Sensing, Orlando, Florida, United States, 30 April - 5 May 2023 | en_US |
dc.description.abstract | We have observed that inhomogeneity can affect the refringence and emission significantly. We are investigating refractive index and the absorption coefficients of multi-functional sensor materials to understand the defect driven changes using birefringence interferometry. In order to simplify and faster data collection, we are exploring low-cost reflectance probe fiber optics designed in-house. In this presentation we will compare the data obtained by using this new system with available literature data. In this paper we will report results of doped ZnSe crystals grown by physical vapor transport method. | en_US |
dc.description.uri | https://www.spiedigitallibrary.org/conference-proceedings-of-spie/12548/1254805/All-optical-approach-to-determine-quality-and-performance-of-sensor/10.1117/12.2661227.full | |
dc.format.extent | 5 pages | |
dc.genre | conference papers and proceedings | en_US |
dc.identifier | doi:10.13016/m2vxyl-vb9z | |
dc.identifier.citation | Brett Setera, Meghan Brandt, Ian Emge, Ching Hua H. Su, Bradley R. Arnold, Fow-Sen Choa, Brian Cullum, Narsingh Bahadur B. Singh, Leslie Scheurer, "All optical approach to determine quality and performance of sensor material (Conference Presentation)," Proc. SPIE 12548, Smart Biomedical and Physiological Sensor Technology XX, 1254805 (14 June 2023); https://doi.org/10.1117/12.2661227 | en_US |
dc.identifier.uri | https://doi.org/10.1117/12.2661227 | |
dc.identifier.uri | http://hdl.handle.net/11603/28349 | |
dc.language.iso | en_US | en_US |
dc.publisher | SPIE | en_US |
dc.relation.isAvailableAt | The University of Maryland, Baltimore County (UMBC) | |
dc.relation.ispartof | UMBC Chemistry & Biochemistry Department Collection | |
dc.relation.ispartof | UMBC Faculty Collection | |
dc.relation.ispartof | UMBC Student Collection | |
dc.relation.ispartof | UMBC Computer Science and Electrical Engineering Department | |
dc.rights | This work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law. | en_US |
dc.rights | Public Domain Mark 1.0 | * |
dc.rights.uri | http://creativecommons.org/publicdomain/mark/1.0/ | * |
dc.title | All Optical Approach to Determine Quality and Performance of Sensor Material | en_US |
dc.type | Text | en_US |
dcterms.creator | https://orcid.org/0000-0003-3634-2646 | en_US |
dcterms.creator | https://orcid.org/0000-0001-9613-6110 | en_US |
dcterms.creator | https://orcid.org/0000-0002-5250-8290 | en_US |
dcterms.creator | https://orcid.org/0000-0002-1810-0283 | en_US |
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