Effect of Doping on the Electrical Characteristics of ZnSe

dc.contributor.authorSingh, Narsingh Bahadur
dc.contributor.authorSu, Ching-Hua
dc.contributor.authorChoa, Fow-Sen
dc.contributor.authorArnold, Bradley
dc.contributor.authorGill, Puneet
dc.contributor.authorSu, Charmain
dc.contributor.authorEmge, Ian
dc.contributor.authorSood, Rachit
dc.date.accessioned2020-08-06T14:33:17Z
dc.date.available2020-08-06T14:33:17Z
dc.date.issued2020-06-27
dc.description.abstractThe effect of sulfur, iron, and chromium doping on the electrical characteristics of ZnSe single crystals was studied. The crystals, grown by the physical vapor transport method (PVT) at NASA Marshall Space Flight Center, were characterized by measuring electrical resistivity, capacitance, and dielectric constant using LCR meter. The morphology was studied by scanning electron microscopy to determine the crystallinity and micro defects. The measured resistivity and dielectric constant showed tunability as the function of frequency in the range of 100 Hz to 100,000 Hz, indicating the suitability of doped material for tuning devices. Besides, for the range from 50 mV to 1000mV, there was no difference in values for the studied frequency range, indicating no degradation or breakdown in the material. All doped ZnSe crystals with sulfur, iron, and chromium showed a similar trend as the function of frequency. Cr-ZnSe showed very high resistivity and lower dielectric constant compared to S-ZnSe and Fe-ZnSe crystals.en_US
dc.description.sponsorshipThis research was patially funded by NASA/Marshall Space Flight Center through a purchase order for services #80NSSC19P1269.en_US
dc.description.urihttps://www.mdpi.com/2073-4352/10/7/551/htmen_US
dc.format.extent11 pagesen_US
dc.genrejournal articlesen_US
dc.identifierdoi:10.13016/m2ncyx-o9tx
dc.identifier.citationSingh, Narsingh Bahadur; Su, Ching-Hua; Choa, Fow-Sen; Arnold, Bradley; Gill, Puneet; Su, Charmain; Emge, Ian; Sood, Rachit; Effect of Doping on the Electrical Characteristics of ZnSe; Crystals 2020, 10(7), 551; https://www.mdpi.com/2073-4352/10/7/551/htmen_US
dc.identifier.urihttps://doi.org/10.3390/cryst10070551
dc.identifier.urihttp://hdl.handle.net/11603/19341
dc.language.isoen_USen_US
dc.publisherMDPIen_US
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Computer Science and Electrical Engineering Department Collection
dc.relation.ispartofUMBC Student Collection
dc.relation.ispartofUMBC Faculty Collection
dc.rightsThis item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.
dc.rightsAttribution 4.0 International (CC BY 4.0)*
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/*
dc.titleEffect of Doping on the Electrical Characteristics of ZnSeen_US
dc.typeTexten_US

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