Third-Order Nonlinear Optical Properties of ALD Grown TiO₂ Films by Thermally Managed Z-scan Method

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dc.contributor.authorBasaldua, I.
dc.contributor.authorBurkins, P.
dc.contributor.authorKuis, R.
dc.contributor.authorKropp, J. A.
dc.contributor.authorGougousi, T.
dc.contributor.authorJohnson, A. M.
dc.date.accessioned2018-10-11T13:09:02Z
dc.date.available2018-10-11T13:09:02Z
dc.date.issued2018
dc.descriptionFrontiers in Optics 2018en_US
dc.description.abstractThermally managed Z-scan performed on ALD grown TiO₂ films demonstrated n₂ values of 1.7×10⁻¹¹ and 1.94 × 10⁻¹⁰cm²/W for films grown at 100°C and 250°C, respectively – greater than 1000X that of other growth methods.en_US
dc.description.urihttps://www.osapublishing.org/abstract.cfm?uri=FiO-2018-JW4A.37en_US
dc.format.extent2 pagesen_US
dc.genreConference Paperen_US
dc.identifierdoi:10.13016/M2MC8RK75
dc.identifier.citationI. Basaldua, P. Burkins, R. Kuis, J. A. Kropp, T. Gougousi, and A. M. Johnson, "Third-Order Nonlinear Optical Properties of ALD Grown TiO2 Films by Thermally Managed Z-scan Method," in Frontiers in Optics / Laser Science, OSA Technical Digest (Optical Society of America, 2018), paper JW4A.37.en_US
dc.identifier.urihttp://hdl.handle.net/11603/11464
dc.language.isoen_USen_US
dc.publisherOptical Society of Americaen_US
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Computer Science and Electrical Engineering Department Collection
dc.relation.ispartofUMBC Faculty Collection
dc.relation.ispartofUMBC Physics Department
dc.rightsThis item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.
dc.rights© 2019 Optical Society of America. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.
dc.subjectLight intensityen_US
dc.subjectNonlinear absorptionen_US
dc.subjectNonlinear opticalen_US
dc.subjectmaterialsen_US
dc.subjectRefractive indexen_US
dc.subjectSolgelen_US
dc.subjectX ray diffractionen_US
dc.titleThird-Order Nonlinear Optical Properties of ALD Grown TiO₂ Films by Thermally Managed Z-scan Methoden_US
dc.typeTexten_US

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