Structural analysis and testing of silicon x-ray mirror modules

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dc.contributor.authorSolly, Peter M.
dc.contributor.authorBiskach, Michael
dc.contributor.authorBonafede, Joseph A.
dc.contributor.authorChan, Kai-Wing
dc.contributor.authorMazzarella, James
dc.contributor.authorMcClelland, Ryan S.
dc.contributor.authorSaha, Dr. Timo T.
dc.contributor.authorZhang, Dr. William W.
dc.date.accessioned2019-10-18T14:51:27Z
dc.date.available2019-10-18T14:51:27Z
dc.date.issued2019-09-09
dc.descriptionSPIE Optical Engineering + Applications, 2019, San Diego, California, United Statesen_US
dc.description.abstractThe fundamental developmental issue facing the next generation of X-ray astronomical telescopes is the manufacturability, assembly, and structural robustness of the grazing incidence optics. Combining the high angular resolution requirements with large effective areas and physical launch vehicle restrictions leads to very thin shelled optics that must remain very stable. Meeting these stability requirements while also surviving launch and space environments presents a significant engineering challenge. Over the last few years, the Next Generation X-ray Optics (NGXO) team at NASA Goddard has been developing thin segmented silicon optics that are assembled into both modules and meta-shells, which show great promise in meeting these challenges. This paper summarizes the analytical approaches, as well as the environmental tests, used to assess such assemblies. Many parameters in the design space of the assembly have been assessed and optimized using Finite Element (FE) models and ray trace algorithms. The results of these analyses have helped shape reasonable and justifiable error budgets, as well as guide the team’s decision making in both near and long term processes. The structural integrity of an assembly has been assessed both with testing and FE models. Preliminary strength testing has been conducted on the basic components used in the assembly.en_US
dc.description.urihttps://spiedigitallibrary.org/conference-proceedings-of-spie/11119/111190B/Structural-analysis-and-testing-of-silicon-x-ray-mirror-modules/10.1117/12.2530338.fullen_US
dc.format.extent20 pagesen_US
dc.genreconference papers and proceedingsen_US
dc.identifierdoi:10.13016/m2z2ff-t7gb
dc.identifier.citationPeter M. Solly, Michael Biskach, Joseph A. Bonafede, Kai-Wing Chan, James Mazzarella, Ryan McClelland, Timo T. Saha, and William W. Zhang "Structural analysis and testing of silicon x-ray mirror modules", Proc. SPIE 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, 111190B (9 September 2019); https://doi.org/10.1117/12.2530338en_US
dc.identifier.urihttps://doi.org/10.1117/12.2530338
dc.identifier.urihttp://hdl.handle.net/11603/15912
dc.language.isoen_USen_US
dc.publisherSPIEen_US
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Center for Space Sciences and Technology
dc.relation.ispartofUMBC Faculty Collection
dc.rightsThis item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.
dc.rightsCopyright 2019 Society of Photo Optical Instrumentation Engineers (SPIE). ©2019 Society of Photo-Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
dc.subjectsilicon mirrorsen_US
dc.subjectmeta-shellen_US
dc.subjectmoduleen_US
dc.subjectmirror assemblyen_US
dc.subjectX-ray opticsen_US
dc.subjectstructural analysisen_US
dc.subjectoptimizationen_US
dc.subjectfinite element modelen_US
dc.titleStructural analysis and testing of silicon x-ray mirror modulesen_US
dc.typeTexten_US

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