Facts and Artifacts in the Blinking Statistics of Semiconductor Nanocrystals

dc.contributor.authorCrouch, Catherine H.
dc.contributor.authorSauter, Orion
dc.contributor.authorWu, Xiaohua
dc.contributor.authorPurcell, Robert
dc.contributor.authorQuerner, Claudia
dc.contributor.authorDrndic, Marija
dc.contributor.authorPelton, Matthew
dc.date.accessioned2023-08-14T19:12:24Z
dc.date.available2023-08-14T19:12:24Z
dc.date.issued2010-04-05
dc.description.abstractSince its initial discovery just over a decade ago, blinking of semiconductor nanocrystals has typically been described in terms of probability distributions for durations of bright, or “on,” states and dark, or “off,” states. These distributions are obtained by binning photon counts in order to construct a time series for emission intensity and then applying a threshold to distinguish on states from off states. By examining experimental data from CdSe/ZnS core/shell nanocrystals and by simulating this data according to a simple, two-state blinking model, we find that the apparent truncated power-law distributions of on times can depend significantly on the choices of binning time and threshold. For example, increasing the binning time by a factor of 10 can double the apparent truncation time and change the apparent power-law exponent by 30%, even though the binning time is only 3% of the truncation time. Our findings indicate that stringent experimental conditions are needed to accurately determine blinking-time probability distributions. Similar considerations should apply to any phenomenon characterized by time series data that displays telegraph noise.en
dc.description.sponsorshipThis work was supported by the HHMI grant to Swarthmore College for undergraduate summer research; partial support at the University of Pennsylvania was provided by the NSF Career Award DMR-0449533 and ONR YIP N000140410489. Work at the Center for Nanoscale Materials was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. We thank Philip Everson and Eric Jensen for advice on statistical analysis, Pavel Frantsuzov and colleagues for advice on the maximum likelihood method, Jack Harris for bringing reference 24 to our attention, and Siying Wang and Tali Dadosh for helpful feedback on the results and the manuscript. Simulations made use of Matlab codes placed in the public domain by Aaron Clauseten
dc.description.urihttps://pubs.acs.org/doi/10.1021/nl100030een
dc.format.extent7 pagesen
dc.genrejournal articlesen
dc.identifierdoi:10.13016/m2uzma-lpta
dc.identifier.citationCrouch, Catherine H., Orion Sauter, Xiaohua Wu, Robert Purcell, Claudia Querner, Marija Drndic, and Matthew Pelton. “Facts and Artifacts in the Blinking Statistics of Semiconductor Nanocrystals.” Nano Letters 10, no. 5 (May 12, 2010): 1692–98. https://doi.org/10.1021/nl100030e.en
dc.identifier.urihttps://doi.org/10.1021/nl100030e
dc.identifier.urihttp://hdl.handle.net/11603/29207
dc.language.isoenen
dc.publisherACSen
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Physics Department Collection
dc.rightsPublic Domain Mark 1.0*
dc.rightsThis work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.en
dc.rights.urihttp://creativecommons.org/publicdomain/mark/1.0/*
dc.titleFacts and Artifacts in the Blinking Statistics of Semiconductor Nanocrystalsen
dc.typeTexten
dcterms.creatorhttps://orcid.org/0000-0002-6370-8765en

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