Enhancing the Resolution of Local Near-Field Probing Measurements With Machine Learning

dc.contributor.authorCho, Emerson K.
dc.contributor.authorSimsek, Ergun
dc.date.accessioned2023-10-06T14:09:23Z
dc.date.available2023-10-06T14:09:23Z
dc.date.issued2023-09-14
dc.description.abstractIn this purely numerical work, we discuss the use of machine learning (ML) techniques to improve the resolution of local near-field probing (LNFP) measurements when the probe used in LNFP is larger than the device being studied. The study demonstrates that through the implementation of ML algorithms, it is possible to achieve a λ/10 spatial resolution even with probes that are a few wavelengths wide, while maintaining a maximum relative error of less than 3%. The investigation further reveals that fully connected neural networks (FCNNs) exhibit superior accuracy compared to linear regression when dealing with limited training datasets. Conversely, for larger training datasets, it is unnecessary to construct and train neural networks, as linear regressions prove to be both sufficient and efficient. These findings establish the potential of employing similar ML approaches to enhance the resolution of measurements obtained from diverse experimental setups.en_US
dc.description.urihttps://ieeexplore.ieee.org/abstract/document/10251397en_US
dc.format.extent5 pagesen_US
dc.genrejournal articlesen_US
dc.genrepostprintsen_US
dc.identifierdoi:10.13016/m2kuuc-gyls
dc.identifier.citationE. K. Cho and E. Simsek, "Enhancing the Resolution of Local Near-Field Probing Measurements With Machine Learning," in IEEE Transactions on Microwave Theory and Techniques, doi: 10.1109/TMTT.2023.3312036.en_US
dc.identifier.urihttps://doi.org/10.1109/TMTT.2023.3312036
dc.identifier.urihttp://hdl.handle.net/11603/30011
dc.language.isoen_USen_US
dc.publisherIEEEen_US
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Computer Science and Electrical Engineering Department Collection
dc.relation.ispartofUMBC Faculty Collection
dc.relation.ispartofUMBC Data Science
dc.rights© 2023 IEEE.  Personal use of this material is permitted.  Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en_US
dc.subjectUMBC Computational Photonics for Multilayered Structure (CPMS) Group
dc.subjectUMBC Computational Photonics Laboratory.
dc.titleEnhancing the Resolution of Local Near-Field Probing Measurements With Machine Learningen_US
dc.typeTexten_US
dcterms.creatorhttps://orcid.org/0000-0001-9075-7071en_US

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