Rayleigh-Scattering-Induced RIN and Amplitude-to-Phase Conversion as a Source of Length-Dependent Phase Noise in OEOs

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RayleighScatteringInducedRINandAmplitudetoPhaseConversion.pdf (1.06 MB)

Links to Files

https://ieeexplore.ieee.org/document/6472719

Permanent Link

https://doi.org/10.1109/JPHOT.2013.2250940
 http://hdl.handle.net/11603/38615

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UMBC Computer Science and Electrical Engineering Department
UMBC Faculty Collection
UMBC Student Collection

Author/Creator

Author/Creator ORCID

https://orcid.org/0000-0003-0269-8433

Date

2013-04

Type of Work

journal articles
Text

Department

Program

Citation of Original Publication

Docherty, Andrew, Curtis R. Menyuk, James P. Cahill, Olukayode Okusaga, and Weimin Zhou. “Rayleigh-Scattering-Induced RIN and Amplitude-to-Phase Conversion as a Source of Length-Dependent Phase Noise in OEOs.” IEEE Photonics Journal 5, no. 2 (April 2013): 5500514–5500514. https://doi.org/10.1109/JPHOT.2013.2250940.

Rights

This work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.
Public Domain

Subjects

Optoelectronic oscillators (OEOs)
Radio frequency
Optical noise
Integrated optics
Optical scattering
Phase noise
Nonlinear optics
optical scattering noise
UMBC Optical Fiber Communications Laboratory
flicker noise
UMBC Computational Photonics Laboratory

Abstract

Optoelectronic oscillators (OEOs) are hybrid RF-photonic oscillators that promise to be environmentally robust frequency sources with very low phase noise. Recent experiments have shown that the excess flicker phase noise in these systems grows with the length of the optical fiber loop. In this paper, we detail a mechanism for this length-dependent flicker noise in which Rayleigh-scattering-induced amplitude noise in the optical fiber combines with amplitude-to-phase noise conversion in the nonlinear electronic components. We derive an analytic model of the loop noise that includes these effects and verify this model by comparing it to numerical calculations and experimental results.