Impact of Nonlinearity Including Bleaching in p-i-n Photodetectors on RF-Modulated Electro-Optic Frequency Combs

dc.contributor.authorMahabadi, Seyed Ehsan Jamali
dc.contributor.authorCarruthers, Thomas F.
dc.contributor.authorMenyuk, Curtis
dc.contributor.authorMcKinney, Jason D.
dc.contributor.authorWilliams, Keith J.
dc.date.accessioned2025-06-05T14:02:35Z
dc.date.available2025-06-05T14:02:35Z
dc.date.issued2021-06-21
dc.description.abstractWe use a drift-diffusion model that includes the effect of bleaching to study the impact of nonlinear distortion in a p-i-n photodetector (PD) on RF-modulated frequency combs. This work complements a similar study that we carried out for a modified uni-traveling carrier (MUTC) PD. We begin by using experimental responsivity data to develop an empirical model of the bleaching in a p-i-n PD when operating in pulsed mode. We then incorporate this model of bleaching into a drift-diffusion model. Next, we use this drift-diffusion model to determine the impact of nonlinearity on the second- and third-order intermodulation distortion products IMD2n and IMD3n as a function of the comb line number n. We then determine the corresponding output intercept points OIP2ₙ and OIP3ₙ and distortion-to-signal ratios ρ₂ₙ and ρ₃ₙ. In contrast to MUTC devices, we find that bleaching increases ρ₂ₙ and ρ₃ₙ at all comb line numbers. However, these distortion products change little as n increases, in contrast to MUTC devices where they grow rapidly as n increases.
dc.description.sponsorshipThis work was supported by the U.S. Naval Research Laboratory under Grant N00173-15-1-G905. The work at the University of Maryland Baltimore County was supported in part by the Naval Research Laboratory.
dc.description.urihttps://ieeexplore.ieee.org/document/9461627
dc.format.extent7 pages
dc.genrejournal articles
dc.identifierdoi:10.13016/m2liqi-7nzj
dc.identifier.citationMahabadi, Seyed Ehsan Jamali, Thomas F. Carruthers, Curtis R. Menyuk, Jason D. McKinney, and Keith J. Williams. “Impact of Nonlinearity Including Bleaching in P-i-n Photodetectors on RF-Modulated Electro-Optic Frequency Combs.” IEEE Photonics Journal 13, no. 4 (August 2021): 1–7. https://doi.org/10.1109/JPHOT.2021.3091039.
dc.identifier.urihttps://doi.org/10.1109/JPHOT.2021.3091039
dc.identifier.urihttp://hdl.handle.net/11603/38545
dc.language.isoen_US
dc.publisherIEEE
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Faculty Collection
dc.relation.ispartofUMBC Computer Science and Electrical Engineering Department
dc.relation.ispartofUMBC Student Collection
dc.rightsThis work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.
dc.rightsPublic Domain
dc.rights.urihttps://creativecommons.org/publicdomain/mark/1.0/
dc.subjectHolographic optical components
dc.subjectOptical attenuators
dc.subjectfrequency combs
dc.subjectUMBC Computational Photonics Laboratory
dc.subjectOptical pulses
dc.subjectOptical imaging
dc.subjectPhotodetector
dc.subjectBleaching
dc.subjectHolography
dc.subjectnonlinearity
dc.subjectPIN photodiodes
dc.subjectUMBC Optical Fiber Communications Laboratory
dc.titleImpact of Nonlinearity Including Bleaching in p-i-n Photodetectors on RF-Modulated Electro-Optic Frequency Combs
dc.typeText
dcterms.creatorhttps://orcid.org/0000-0003-4718-6976
dcterms.creatorhttps://orcid.org/0000-0002-5002-1657
dcterms.creatorhttps://orcid.org/0000-0003-0269-8433

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