XRISM/Xtend Transient Search (XTS) detected an X-ray flare possibly from an M dwarf star

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https://www.astronomerstelegram.org/?read=17071

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http://hdl.handle.net/11603/40319

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UMBC Physics Department
UMBC Center for Space Sciences and Technology (CSST) / Center for Research and Exploration in Space Sciences & Technology II (CRSST II)
UMBC Faculty Collection

Author/Creator

Author/Creator ORCID

https://orcid.org/0000-0002-4656-6881

Date

2025-03-10

Type of Work

articles
Text

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Program

Citation of Original Publication

Yoneyama, T., K. Fukushima, K. Hayashi, K. Pottschmidt, et al. “XRISM/Xtend Transient Search (XTS) Detected an X-Ray Flare Possibly from an M Dwarf Star.” The Astronomer’s Telegram, March 10, 2025. https://www.astronomerstelegram.org/?read=17071.

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Subjects

 X-ray flare
X-ray source XRISM J1748-2832

Abstract

XRISM/Xtend Transient Search (XTS) detected an X-ray flare from an X-ray source XRISM J1748-2832 on 2025-03-09 TT. The source position is determined to be (R.A., Dec.) = (266.890 -28.538), with a systematic error of ∼ 40 arcsec. A plausible counterpart is an X-ray source CXOGCS J174734.5-283215, a potential M dwarf star located ∼ 14 asec apart from the position of XRISM J1748-2832. Another counterpart candidate is a YSO candidate SPICY 64348 located ∼ 21 arcsec apart from XRISM J1748-2832. Distances to CXOGCS J174734.5-283215 and SPICY 64348 are ∼ 590 and ∼ 500 pc, respectively by Gaia DR3. The flare started on 2025-03-09 at 06:25 TT, rapidly peaked at 06:31 TT, and then exponentially decayed in ∼ 3 ksec. The timing properties are derived by fitting the 0.4 – 2.0 keV light curve with a constant + burst model in the QDP software package. The flux at the flare phase is calculated as 1.2 × 10⁻¹² erg s⁻¹ cm⁻² (0.4 – 2.0 keV). A systematic error of roughly 20% should be added to the statistical error. Corresponding luminosity is 5.1 D²₅₉₀ ₚ꜀ × 10³¹ erg s⁻¹ . We derived the above systematic error for the flux by comparing our derived values for the sources detected with XTS in several observations with those for the corresponding X-ray counterparts. We estimated the systematic error for the source position from the separations between the detected sources with the corresponding counterparts in the same field of view.