A Multiscale Simulator for Low Pressure Chemical Vapor Deposition
Links to Files
Collections
Author/Creator
Author/Creator ORCID
Date
Type of Work
Department
Program
Citation of Original Publication
Gobbert, Matthias K., Tushar P. Merchant, Leonard J. Borucki, and Timothy S. Cale. “A Multiscale Simulator for Low Pressure Chemical Vapor Deposition.” Journal of The Electrochemical Society 144, no. 11 (1997): 3945. https://doi.org/10.1149/1.1838116.
Rights
This item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.
Subjects
Abstract
An integrated simulator for chemical vapor deposition is introduced. In addition to reactor scale and feature scale simulators, it includes a “mesoscopic” scale simulator with the typical length scale of a die. It is shown that the “three‐scale” integrated simulator used is a proper extension of “two‐scale” deposition simulators that consist of reactor scale and feature scale simulation models. Moreover, it is demonstrated that information is provided on a new length scale, for which no information is available from the “two‐scale” approach, as well as important corrections to the simulation results on the reactor scale. This enables, for instance, studies of microloading. Thermally induced deposition of silicon dioxide from tetraethyoxysilane is chosen as the application example. The deposition chemistry is modeled using six gaseous reacting species involved in four gas‐phase and eight surface reactions.
