A geometry-dependent surface Lambertian-equivalent reflectivity product for UV–Vis retrievals – Part 2: Evaluation over open ocean

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Citation of Original Publication

Fasnacht, Zachary, Alexander Vasilkov, David Haffner, Wenhan Qin, Joanna Joiner, Nickolay Krotkov, Andrew M. Sayer, and Robert Spurr. “A Geometry-Dependent Surface Lambertian-Equivalent Reflectivity Product for UV–Vis Retrievals – Part 2: Evaluation over Open Ocean.” Atmospheric Measurement Techniques 12, no. 12 (December 19, 2019): 6749–69. https://doi.org/10.5194/amt-12-6749-2019.

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This work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.
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Abstract

Satellite-based cloud, aerosol, and trace-gas retrievals from ultraviolet (UV) and visible (Vis) wavelengths depend on the accurate representation of surface reflectivity. Current UV and Vis retrieval algorithms typically use surface reflectivity climatologies that do not account for variation in satellite viewing geometry or surface roughness. The concept of geometry-dependent surface Lambertian-equivalent reflectivity (GLER) is implemented for water surfaces to account for surface anisotropy using a Case 1 water optical model and the Cox–Munk slope distribution for ocean surface roughness. GLER is compared with Lambertian-Equivalent reflectivity (LER) derived from the Ozone Monitoring Instrument (OMI) for clear scenes at 354, 388, 440, and 466 nm. We show that GLER compares well with the measured LER data over the open ocean and captures the directionality effects not accounted for in climatological LER databases. Small biases are seen when GLER and the OMI-derived LER are compared. GLER is biased low by up to 0.01–0.02 at Vis wavelengths and biased high by around 0.01 in the UV, particularly at 354 nm. Our evaluation shows that GLER is an improvement upon climatological LER databases as it compares well with OMI measurements and captures the directionality effects of surface reflectance.