Third-Order Nonlinear Optical Properties of ALD Grown TiO₂ Films by Thermally Managed Z-scan Method
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Date
2018
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Citation of Original Publication
I. Basaldua, P. Burkins, R. Kuis, J. A. Kropp, T. Gougousi, and A. M. Johnson, "Third-Order Nonlinear Optical Properties of ALD Grown TiO2 Films by Thermally Managed Z-scan Method," in Frontiers in Optics / Laser Science, OSA Technical Digest (Optical Society of America, 2018), paper JW4A.37.
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© 2019 Optical Society of America. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.
© 2019 Optical Society of America. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.
Abstract
Thermally managed Z-scan performed on ALD grown TiO₂ films demonstrated n₂ values of 1.7×10⁻¹¹ and 1.94 × 10⁻¹⁰cm²/W for films grown at 100°C and 250°C, respectively – greater than 1000X that of other growth methods.