"Red edge" optical properties of corn leaves from different nitrogen regimes

Thumbnail Image

Files

Red_edge_optical_properties_of_corn_leaves_from_different_nitrogen_regimes.pdf (164.07 KB)

Links to Files

https://ieeexplore.ieee.org/document/1026495

Permanent Link

https://doi.org/10.1109/IGARSS.2002.1026495
 http://hdl.handle.net/11603/28663

Collections

UMBC Joint Center for Earth Systems Technology (JCET)
UMBC Geography and Environmental Systems Department
UMBC GESTAR II

Author/Creator

Author/Creator ORCID

https://orcid.org/0000-0002-0505-4951

Date

2002-11-07

Type of Work

conference papers and proceedings
Text

Department

Program

Citation of Original Publication

E. M. Middleton, P. K. E. Campbell, J. E. McMurtrey, L. A. Corp, L. M. Butcher and E. W. Chappelle, ""Red edge" optical properties of corn leaves from different nitrogen regimes," IEEE International Geoscience and Remote Sensing Symposium, Toronto, ON, Canada, 2002, pp. 2208-2210 vol.4, doi: 10.1109/IGARSS.2002.1026495.

Rights

This work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.
Public Domain Mark 1.0

Subjects

Abstract

High resolution (<2 nm) optical spectra and biophysical measurements were acquired from corn leaves from field plots having four nitrogen fertilizer application rates: 20%, 50%, 100% and 150% of optimal levels. Reflectance (R), transmittance (T), and absorptance (A) spectra were obtained for both adaxial and abaxial leaf surfaces. The strongest relationships between foliar chemistry and optical properties were demonstrated for C/N content and two optical parameters associated with the "red edge inflection point" (REIP): 1) anormalized first derivative maximum (Dmax) occurring between 695 and 730 nm (Dmax/D744); and 2) the wavelength associated with Dmax (WL of REIP). A nonlinear increase in the Dmax/D744 ratio as a function of C/N content was observed for all optical properties (r/sup 2/ = 0.90-0.95). Similarly, a nonlinear decrease in the WL of REIP as a function of C/N content was observed for all optical properties (RT, RB, TT, and AT) (r/sup 2/ = 0.85-0.96). The Dmax/D744 ratio increased as the WL of REIP declined from /spl sim/730 to 700 nm, with curves per optical property expressing different degrees of nonlinearity.