Mean Shift for Self-Supervised Learning

dc.contributor.authorKoohpayegani, Soroush Abbasi
dc.contributor.authorTejankar, Ajinkya
dc.contributor.authorPirsiavash, Hamed
dc.date.accessioned2021-05-03T16:21:59Z
dc.date.available2021-05-03T16:21:59Z
dc.date.issued2022-02-28
dc.description2021 IEEE/CVF International Conference on Computer Vision (ICCV), 10-17 October 2021
dc.description.abstractMost recent self-supervised learning (SSL) algorithms learn features by contrasting between instances of images or by clustering the images and then contrasting between the image clusters. We introduce a simple mean-shift algorithm that learns representations by grouping images together without contrasting between them or adopting much of prior on the structure of the clusters. We simply “shift” the embedding of each image to be close to the “mean” of its neighbors. Since in our setting, the closest neighbor is always another augmentation of the same image, our model will be identical to BYOL when using only one nearest neighbor instead of 5 as used in our experiments. Our model achieves 72.4% on ImageNet linear evaluation with ResNet50 at 200 epochs outperforming BYOL.en_US
dc.description.sponsorshipThis material is based upon work partially supported by the United States Air Force under Contract No. FA8750-19-C-0098, funding from SAP SE, and also NSF grant number 1845216. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the authors and do not necessarily reflect the views of the United States Air Force, DARPA, or other funding agencies.en_US
dc.description.urihttps://ieeexplore.ieee.org/abstract/document/9710772en_US
dc.description.urihttps://github.com/UMBCvision/MSF
dc.format.extent15 pagesen_US
dc.genreconference papers and proceedingsen_US
dc.genrepreprints
dc.identifierdoi:10.13016/m2pgoz-aedh
dc.identifier.citationS. A. Koohpayegani, A. Tejankar and H. Pirsiavash, "Mean Shift for Self-Supervised Learning," 2021 IEEE/CVF International Conference on Computer Vision (ICCV), 2021, pp. 10306-10315, doi: 10.1109/ICCV48922.2021.01016.
dc.identifier.urihttp://hdl.handle.net/11603/21426
dc.identifier.urihttps://doi.org/10.1109/ICCV48922.2021.01016
dc.language.isoen_USen_US
dc.publisherIEEE
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Computer Science and Electrical Engineering Department Collection
dc.relation.ispartofUMBC Student Collection
dc.relation.ispartofUMBC Faculty Collection
dc.rights© 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.titleMean Shift for Self-Supervised Learningen_US
dc.typeTexten_US

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