Security Order of Gate-Level Masking Schemes
Files
Links to Files
Permanent Link
Author/Creator ORCID
Date
Type of Work
Department
Program
Citation of Original Publication
Rights
This item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.
Subjects
Abstract
Masking schemes have been introduced to thwart
side-channel attacks. In software applications, attackers can
measure leakage at several points in time and combine them to
defeat the masking. In hardware gate-level masking, all shares
of a masked variable are manipulated at the same time in
a nanoscale circuit. In this article, we focus on setups where
the attacker uses one mesoscopic probe, which measures an
aggregated leakage of all shares. We consider masking schemes
where each bit is randomly split (by XOR) into so-called shares
(two or more). We analyze two interesting case studies about the
interrelationship of attack order vs. the number of shares. First of
all, we show that when the unique probe is measuring the sum
of each share’s individual leakage (so-called Hamming weight
model), one measurement can reveal the sensitive unshared value,
provided the attacker is able to determine the leakage’s least
significant bit. Second, we analyze a hardware masking belonging
to threshold schemes. Such schemes require fulfilling a so-called
incompleteness property, whereby some input shares must be
absent from output shares. We analyze a first-order incomplete
scheme, i.e., where the number of missing input shares is equal to
one. In schemes such as threshold implementation, this requires
the number of shares to be strictly more than two. Hence the
natural question is whether such a scheme would resist highorder attacks of order also strictly more than two? We answer
by the negative, and show that the lowest attack order is two:
the security of such a masking scheme is governed by the order
of incompleteness and not by the number of shares. We verify
our findings using four different sets of experiments including
theoretical analysis, digital simulation, HSpice simulation and
also real-silicon (FPGA emulation).
