Enhancement of Non-Destructive Measurement Resolution with Neural Networks

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dc.contributor.authorSimsek, Ergun
dc.contributor.authorCho, Emerson K.
dc.date.accessioned2024-09-04T19:58:33Z
dc.date.available2024-09-04T19:58:33Z
dc.date.issued2024-09-30
dc.description2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting, 14-19 July 2024, Firenze, Italy
dc.description.abstractSimilar to image sharpening, the resolution of measured electromagnetic fields can be enhanced with machine learning. We numerically demonstrate that a λ/10 spatial resolution is achievable even with probes that are a few wavelengths wide, while maintaining a maximum relative error of less than 3%.
dc.description.urihttps://ieeexplore.ieee.org/document/10686643
dc.format.extent2 pages
dc.genreconference papers and proceedings
dc.genrepostprints
dc.identifierdoi:10.1109/AP-S/INC-USNC-URSI52054.2024.10686643
dc.identifier.citationSimsek, Ergun, and Emerson K. Cho. “Enhancement of Non-Destructive Measurement Resolution with Neural Networks.” 2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), July 2024, 1151–52. https://doi.org/10.1109/AP-S/INC-USNC-URSI52054.2024.10686643.
dc.identifier.urihttp://hdl.handle.net/11603/35973
dc.identifier.urihttps://doi.org/10.1109/AP-S/INC-USNC-URSI52054.2024.10686643
dc.language.isoen_US
dc.publisherIEEE
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Computer Science and Electrical Engineering Department
dc.relation.ispartofUMBC Faculty Collection
dc.relation.ispartofUMBC Data Science
dc.relation.ispartofUMBC Student Collection
dc.rights© 2024 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.titleEnhancement of Non-Destructive Measurement Resolution with Neural Networks
dc.typeText
dcterms.creatorhttps://orcid.org/0000-0001-9075-7071

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