Planning in-flight calibration for XRISM
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Miller, E. D., “Planning in-flight calibration for XRISM”, in Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series, 2020, vol. 11444. doi:10.1117/12.2561608.
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This work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.
This work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.
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Abstract
The XRISM X-ray observatory will fly two advanced instruments, the Resolve high-resolution spectrometer and the Xtend wide-field imager. These instruments, particularly Resolve, pose calibration challenges due to the unprecedented combination of spectral resolution, spectral coverage, and effective area, combined with a need to characterize the imaging fidelity of the full instrument system to realize the mission’s ambitious science goals. We present the status of the XRISM in-flight calibration plan, building on lessons from Hitomi and other X-ray missions. We present a discussion of targets and observing strategies to address the needed calibration measurements, with a focus on developing methodologies to plan a thorough and flexible calibration campaign and provide insight on calibration systematic error. We also discuss observations that exploit Resolve’s spectral