Design and measurements of n for the multicomponent semiconductor

Abstract

A great deal of research has been performed on refractive index n and extinction coefficient k due to varieties of applications in optical industries. The dispersion equation is described for the photons of varying energies and their interactions with materials since there is a strong correlation of n and k with wavelength. Measurements based on reflectance can be expensive and are very difficult due to compositional variations. We present a low-cost reflectance probe fiber optics designed in-house to determine the absorption coefficients and refractive index of solids. The solutions using a modified Beer-Lamberts Law and merging the concentration and extinction coefficient terms into an absorption coefficient, α, can be given by the equation I = I0 exp (-α* d) where I is the transmitted intensity, I0 is incident intensity and d is the thickness. We have experimented with several semiconductor compounds for this study.