Using Digital Sensors to Leverage Chips' Security

dc.contributor.authorEbrahimabadi, Mohammad
dc.contributor.authorAnik, Md Toufiq Hasan
dc.contributor.authorDanger, Jean-Luc
dc.contributor.authorGuilley, Sylvain
dc.contributor.authorKarimi, Naghmeh
dc.date.accessioned2021-03-16T16:07:13Z
dc.date.available2021-03-16T16:07:13Z
dc.date.issued2021-02-03
dc.description2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), 15-16 Dec. 2020, IEEE, Washington, DC, USAen_US
dc.description.abstractOne way for an attacker to break a system is to perturb it. Expected effects are countermeasure deactivation or data corruption to disclose sensitive information. The prevention of such actions relies on detection of abnormal operating conditions. Digital sensors can play this role. A digital sensor is built out of the very same standard cells as the user logic to be protected. This ensures the advantage that the sensor and the user logic are exposed to the same stress. Balancing True positives and False negatives is a tough question in field of sensors. This is a general issue, and the best way to mitigate this paradox is to thoroughly investigate their properties, through simulations and real experiments. This results in characterizations, which in turn allows for intuitions on how to handle sensing values. In this paper, we exhibit the complex relationships between propagation times in logic and environmental conditions. Those results reinforce the relevance of the digital sensor versus the adversarial manipulation of environmental conditions: fewer false alarms are raised even if temperature (resp. voltage) is extreme, provided the effect is balanced by voltage (resp. temperature). Owing to the complex relationship between propagation delays, temperature and voltage, this cannot happen with a set of independent temperature and voltage sensorsen_US
dc.description.urihttps://ieeexplore.ieee.org/abstract/document/9337730en_US
dc.format.extent6 pagesen_US
dc.genreconference papers and proceedings postprintsen_US
dc.identifierdoi:10.13016/m2dqsx-layy
dc.identifier.citationM. Ebrahimabadi, M. T. H. Anik, J. -L. Danger, S. Guilley and N. Karimi, "Using Digital Sensors to Leverage Chips' Security," 2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), Washington, DC, USA, 2020, pp. 1-6, doi: 10.1109/PAINE49178.2020.9337730.en_US
dc.identifier.urihttps://doi.org/10.1109/PAINE49178.2020.9337730
dc.identifier.urihttp://hdl.handle.net/11603/21184
dc.language.isoen_USen_US
dc.publisherIEEEen_US
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Computer Science and Electrical Engineering Department Collection
dc.relation.ispartofUMBC Faculty Collection
dc.relation.ispartofUMBC Student Collection
dc.rightsThis item is likely protected under Title 17 of the U.S. Copyright Law. Unless on a Creative Commons license, for uses protected by Copyright Law, contact the copyright holder or the author.
dc.rights© 2020 IEEE.  Personal use of this material is permitted.  Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.titleUsing Digital Sensors to Leverage Chips' Securityen_US
dc.typeTexten_US

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