Simple approach for high-contrast optical imaging and characterization of graphene-based sheets

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https://pubs.acs.org/doi/10.1021/nl0714177

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https://doi.org/10.1021/nl0714177
 http://hdl.handle.net/11603/29219

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UMBC Physics Department

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https://orcid.org/0000-0002-6370-8765

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2007-11-02

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journal articles
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Citation of Original Publication

Jung, Inhwa, Matthew Pelton, Richard Piner, Dmitriy A. Dikin, Sasha Stankovich, Supinda Watcharotone, Martina Hausner, and Rodney S. Ruoff. “Simple Approach for High-Contrast Optical Imaging and Characterization of Graphene-Based Sheets.” Nano Letters 7, no. 12 (December 1, 2007): 3569–75. https://doi.org/10.1021/nl0714177.

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This work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.
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Abstract

A simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast between the graphene-based materials and the substrate is obtained by choosing appropriate optical properties and thickness of the dielectric layer. The effective refractive index and optical absorption coefficient of graphene oxide, thermally reduced graphene oxide, and graphene are obtained by comparing the predicted and measured contrasts.