Simple approach for high-contrast optical imaging and characterization of graphene-based sheets

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dc.contributor.authorJung, Inhwa
dc.contributor.authorPelton, Matthew
dc.contributor.authorPiner, Richard
dc.contributor.authorDikin, Dmitriy A.
dc.contributor.authorStankovich, Sasha
dc.contributor.authorWatcharotone, Supinda
dc.contributor.authorHausner, Martina
dc.contributor.authorRuoff, Rodney S.
dc.date.accessioned2023-08-14T20:08:54Z
dc.date.available2023-08-14T20:08:54Z
dc.date.issued2007-11-02
dc.description.abstractA simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast between the graphene-based materials and the substrate is obtained by choosing appropriate optical properties and thickness of the dielectric layer. The effective refractive index and optical absorption coefficient of graphene oxide, thermally reduced graphene oxide, and graphene are obtained by comparing the predicted and measured contrasts.en_US
dc.description.sponsorshipWe gratefully acknowledge support from the National Science Foundation (CMS-0510212), the Naval Research Laboratory (No. N00173-04-2-C003), and the DARPA Center on Nanoscale Science and Technology for Integrated Micro/NanoElectromechanical Transducers (iMINT) (Award No. HR0011-06-1-0048). We appreciate assistance by W. Russin (confocal microscopy) and M. Takita (deposition of graphene platelets onto silicon nitride substrates). Work at the Center for Nanoscale Materials was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. We thank D. Gosztola for technical assistance with variable-wavelength confocal microscopy.en_US
dc.description.urihttps://pubs.acs.org/doi/10.1021/nl0714177en_US
dc.format.extent7 pagesen_US
dc.genrejournal articlesen_US
dc.identifierdoi:10.13016/m2sqid-05lp
dc.identifier.citationJung, Inhwa, Matthew Pelton, Richard Piner, Dmitriy A. Dikin, Sasha Stankovich, Supinda Watcharotone, Martina Hausner, and Rodney S. Ruoff. “Simple Approach for High-Contrast Optical Imaging and Characterization of Graphene-Based Sheets.” Nano Letters 7, no. 12 (December 1, 2007): 3569–75. https://doi.org/10.1021/nl0714177.en_US
dc.identifier.urihttps://doi.org/10.1021/nl0714177
dc.identifier.urihttp://hdl.handle.net/11603/29219
dc.language.isoen_USen_US
dc.publisherACSen_US
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Physics Department Collection
dc.rightsThis work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.en_US
dc.rightsPublic Domain Mark 1.0*
dc.rights.urihttp://creativecommons.org/publicdomain/mark/1.0/*
dc.titleSimple approach for high-contrast optical imaging and characterization of graphene-based sheetsen_US
dc.typeTexten_US
dcterms.creatorhttps://orcid.org/0000-0002-6370-8765en_US

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