Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry

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dc.contributor.authorJung, Inhwa
dc.contributor.authorVaupel, Matthias
dc.contributor.authorPelton, Matthew
dc.contributor.authorPiner, Richard
dc.contributor.authorDikin, Dmitriy A.
dc.contributor.authorStankovich, Sasha
dc.contributor.authorAn, Jinho
dc.contributor.authorRuoff, Rodney S.
dc.date.accessioned2023-08-14T19:11:00Z
dc.date.available2023-08-14T19:11:00Z
dc.date.issued2008-05-16
dc.description.abstractThe dispersion functions for the refractive index and the extinction coefficient of single- and multiple-layer graphene oxide samples were measured by imaging spectroscopic ellipsometry in the wavelength range of 350−1000 nm and were compared to previously reported results measured by confocal microscopy. The dispersion functions for thin platelets were also compared to those obtained by standard spectroscopic ellipsometry on a deposit consisting of many overlapping graphene oxide layers. Changes were observed in both the thickness of the deposits and the values of the dispersion parameters following heating. A model is proposed to explain these observations, based on the removal of water between the graphene-oxide layers upon thermal treatment.en_US
dc.description.sponsorshipWe thank Rob Ilic of the Cornell NanoScale Science & Technology Facility for the growth of silicon nitride film and Bob Lajos of Nanotechnology Core Facility at University of Illinois at Chicago for helping I.J. to grow the silicon dioxide film. We also thank Abel Thangawng for helping I.J. to preapre PDMS film and D. Gosztola for technical assistance with variable wavelength confocal microscopy. We gratefully acknowledge support from the DARPA Center on Nanoscale Science and Technology for Integrated Micro/Nano-Electromechanical Transducers (iMINT) (Award No: HR0011-06-1-0048). Work at the Center for Nanoscale Materials was supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.en_US
dc.description.urihttps://pubs.acs.org/doi/10.1021/jp802173men_US
dc.format.extent8 pagesen_US
dc.genrejournal articlesen_US
dc.identifierdoi:10.13016/m243l0-lmqi
dc.identifier.citationJung, Inhwa, Matthias Vaupel, Matthew Pelton, Richard Piner, Dmitriy A. Dikin, Sasha Stankovich, Jinho An, and Rodney S. Ruoff. “Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry.” The Journal of Physical Chemistry C 112, no. 23 (June 1, 2008): 8499–8506. https://doi.org/10.1021/jp802173m.en_US
dc.identifier.urihttps://doi.org/10.1021/jp802173m
dc.identifier.urihttp://hdl.handle.net/11603/29201
dc.language.isoen_USen_US
dc.publisherACSen_US
dc.relation.isAvailableAtThe University of Maryland, Baltimore County (UMBC)
dc.relation.ispartofUMBC Physics Department Collection
dc.rightsThis work was written as part of one of the author's official duties as an Employee of the United States Government and is therefore a work of the United States Government. In accordance with 17 U.S.C. 105, no copyright protection is available for such works under U.S. Law.en_US
dc.rightsPublic Domain Mark 1.0*
dc.rights.urihttp://creativecommons.org/publicdomain/mark/1.0/*
dc.titleCharacterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometryen_US
dc.typeTexten_US
dcterms.creatorhttps://orcid.org/0000-0002-6370-8765en_US

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